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Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12128/11933
Title: 3_D surface stereometry of Ag/DLC nanocomposite prepared by RF-PECVD
Authors: Stach, Sebastian
Ţălu, Ştefan
Abdolghaderi, Senour
Shafiekhani, Azizollah
Bahmanie, Jahangir
Keywords: Ag/DLC nanocomposite; Atomic force microscopy; RF-PECVD; Stereometric analysis; Surface microtexture
Issue Date: 2019
Citation: “Results in Physics” Vol. 15, 2019, art. no .102731, s. 1-8
Abstract: In this study, a stereometric analysis of the three-dimensional (3-D) surfaces of the Ag/diamond-like carbon (DLC) nanocomposite films was done. The nanocomposite thin films were fabricated by Radio Frequency Plasma-Enhanced Chemical Vapour Deposition (RF-PECVD). The 3-D surface microtexture was studied by high-resolution Atomic Force Microscopy (AFM) records combined with statistical analyses. More detailed information about surface statistical parameters and topographic features of analyzed samples were performed. The statistical parameters relating to the segmented motifs consistent with ISO 25178-2: 2012 have been generated using MountainsMap® Premium software. The analysis was performed by modeling Ag/DLC nanocomposite surface microtexture based on motif analysis (detection of essential characteristics in terms of surface dimensions, volume, curvature, shape) to be included in computer interactive simulation algorithms.
URI: http://hdl.handle.net/20.500.12128/11933
DOI: 10.1016/j.rinp.2019.102731
ISSN: 2211-3797
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