Determination of crystal orientation by Ω-scan method in nickel-based single-crystal turbine blades

Abstract

The article presents an assessment of the crystal perfection of single-crystal turbine blades based on the crystal orientation and lattice parameter distribution on their surface. Crystal orientation analysis was conducted by the X-ray diffraction method Ω-scan and the X-ray diffractometer provided by the EFG Company. The Ω-scan method was successfully used for evaluation of the crystal orientation and lattice parameters in semiconductors. A description of the Ω-scan method and an example of measurement of crystal orientation compared to the Laue and EBSD methods are presented.