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Title: “DistorX” program for analysis of structural distortions affecting X-ray diffraction patterns
Authors: Kalinowski, Lech
Goraus, Jerzy
Ślebarski, Andrzej
Keywords: DistorX; X-ray; diffraction
Issue Date: 2018
Citation: AIP Advances, vol. 8 (2018), Art. No. 101334
Abstract: For the purposes of research on strongly correlated electronic systems (SCES), a computer program, DistorX (Distortion or X-ray diffraction patterns), was created. The program is an interactive Jupyter notebook for simulating the effects of structural distortions on X-ray diffraction patterns. The program is designed to be universal, in that it may be successfully applied to a variety of structures. In previous reports, a structural transition from a cubic phase of Yb3Rh4Sn13 – type to the superlattice variantwas been observed at 160 K for a series of skutterudite-related Ce3M4Sn13 compounds, where M = Co, Ru or Rh. In this work, we use a specialized build of DistorX to simulate the low-temperature X-ray diffraction patterns of a distorted unit cell. The method described here obtains simulated XRD patterns from the atomic positions and permits investigation of crystal structure without imposed symmetry operations. We further indicate the crystallographic plane in which the distortion occurs, and explain the possible origin of CDW in these materials.
DOI: 10.1063/1.5042654
ISSN: 2158-3226
Appears in Collections:Artykuły (WMFiCH)

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