Application of third generation synchrotron source to studies of noncrystalline materials : In-Se amorphous films

Abstract

The local structure of vacuum evaporated In-Se amorphous films, containing 50, 60, and 66 at .% Se, was studied using differential anomalous X -ray scattering and extended X -ray absorption fine structure. Both intensity and absorption spectra were measured in the vicinity of the absorption K -edge of Se. The differential anomalous X -ray scattering data were converted to real space by the inverse Fourier transform yielding the differential radial distribution functions. The obtained results provide evidence for the presence of Se-In spatial correlations for In5 0 Se50 and Se-In and Se-Se correlations for In40 Se60 and In34 Se66 within the first coordination sphere.