Methods of correction of typical defects in the digital images on the example of SEM images of anodic oxide layers

Abstract

The paper proposes one of the possible methods of image quality improvements. There are materials whose preparation for microstructure observation is difficult and, despite the effort, poor quality images are obtained. Computer image processing techniques allow for image transformation by means of various tools and obtaining much better images, with much more visible details than in the raw image. When it is impossible to prepare the sample better for microscopy observation and microstructural analysis, proper image processing is the only solution to gather information about the tested material.