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Zastosuj identyfikator do podlinkowania lub zacytowania tej pozycji: http://hdl.handle.net/20.500.12128/19720
Tytuł: Is a dissociation process underlying the molecular origin of the Debye process in monohydroxy alcohols?
Autor: Soszka, Natalia
Hachuła, Barbara
Tarnacka, Magdalena
Kamińska, Ewa
Pawlus, Sebastian
Kamiński, Kamil
Paluch, Marian
Słowa kluczowe: Debye process; monohydroxy alcohols
Data wydania: 2021
Źródło: Journal of Physical Chemistry B, 2021, iss. 11, s. 2960-2967
Abstrakt: Herein, we investigated the molecular dynamics as well as intra-molecular interactions in two primary monohydroxy alcohols (MA), 2-ethyl-1-hexanol (2EHOH) and n-butanol (nBOH), by means of broad-band dielectric (BDS) and Fourier transform infrared (FTIR) spectroscopy. The modeling data obtained from dielectric studies within the Rubinstein approach [Macromolecules 2013, 46, 7525−7541] originally developed to describe the dynamical properties of self-assembling macromolecules allowed us to calculate the energy barrier (Ea)of dissociation from the temperature dependences of relaxation times of Debye and structural processes. We found Ea ∼ 19.4 ± 0.8 and 5.3 ± 0.4 kJ/mol for the former and latter systems, respectively. On the other hand, FTIR data analyzed within the van’tHoff relationship yielded the energy barriers for dissociation Ea ∼ 20.3 ± 2.1 and 12.4 ± 1.6 kJ/mol for 2EHOH and nBOH, respectively. Hence, there was almost a perfect agreement between the values of Ea estimated from dielectric and FTIR studies for the 2EHOH, while some notable discrepancy was noted for the second alcohol. A quite significant difference in the activation barrier of dissociation indicates that there are probably supramolecular clusters of varying geometry or a ring-chain-like equilibrium is strongly affected in both alcohols. Nevertheless, our analysis showed that the association/dissociation processes undergoing within nanoassociates are one of the main factors underlying the molecular origin of the Debye process, supporting the transient chain model.
URI: http://hdl.handle.net/20.500.12128/19720
DOI: 10.1021/acs.jpcb.0c10970
ISSN: 1520-6106
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