IFAC Proceedings Volumes, Vol. 37, iss. 20 (2004), s. 252-256
In BIST structures feedback registers play the role of test generators and test response compactors. Linear feedback shift registers (LFSR) are here of predominating importance. These registers are relatively simple in designing. Non-linear feedback shift registers designing to diagnostic aims is considerably more complicated. The possibility to use the genetic programming to design the non-linear feedback shift registers is presented in the article. Usefulness of this approach to design the registers helpful in the BIST structures is testified by numerous examples.