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Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12128/4268
Title: B16: Genetic programming in feedback registers designing
Authors: Gościniak, Ireneusz
Keywords: register; feedback; design; tests; testability; programming
Issue Date: 18-Nov-2004
Citation: IFAC Proceedings Volumes, Vol. 37, iss. 20 (2004), s. 252-256
Abstract: In BIST structures feedback registers play the role of test generators and test response compactors. Linear feedback shift registers (LFSR) are here of predominating importance. These registers are relatively simple in designing. Non-linear feedback shift registers designing to diagnostic aims is considerably more complicated. The possibility to use the genetic programming to design the non-linear feedback shift registers is presented in the article. Usefulness of this approach to design the registers helpful in the BIST structures is testified by numerous examples.
URI: http://hdl.handle.net/20.500.12128/4268
DOI: 10.1016/S1474-6670(17)30606-7
ISSN: 1474-6670
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