DC pole | Wartość | Język |
dc.contributor.author | Chodacki, Miłosław | - |
dc.date.accessioned | 2018-11-06T12:09:35Z | - |
dc.date.available | 2018-11-06T12:09:35Z | - |
dc.date.issued | 2018 | - |
dc.identifier.citation | Vietnam Journal of Computer Science, Vol. 5 (2018), s. 263-278 | pl_PL |
dc.identifier.issn | 2196-8896 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.12128/6963 | - |
dc.description.abstract | The paper presents the use of Genetic Algorithm to search for non-linear Autonomous Test Structures (ATS) in Built-In
Testing approach. Such structures can include essentially STP and CSTP and their modifications. Non-linear structures are
more difficult to analyze than the widely used structures such as independent Test Pattern Generator and the Test Response
Compactor realized by Linear Feedback Shift Registers. To reduce time-consuming test simulation of sequential circuit, it
was used an approach based on the stochastic model of pseudo-random testing. The use of stochastic model significantly
affects the time effectiveness of the search for evolutionary autonomous structures. In test simulation procedure, the block of
sequential circuit memory is not disconnected. This approach does not require a special selection of memory registers such
as BILBOs. A series of studies to test circuits set ISCAS’89 are made. The results of the study are very promising. | pl_PL |
dc.language.iso | en | pl_PL |
dc.rights | Uznanie autorstwa 3.0 Polska | * |
dc.rights.uri | http://creativecommons.org/licenses/by/3.0/pl/ | * |
dc.subject | Built-in self-test | pl_PL |
dc.subject | Self-test path | pl_PL |
dc.subject | Digital testing | pl_PL |
dc.subject | Genetic algorithm | pl_PL |
dc.title | Genetic algorithm as self-test path and circular self-test path design method | pl_PL |
dc.type | info:eu-repo/semantics/article | pl_PL |
dc.relation.journal | Vietnam Journal of Computer Science | pl_PL |
dc.identifier.doi | 10.1007/s40595-018-0121-0 | - |
Pojawia się w kolekcji: | Artykuły (WNŚiT)
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