Structure refinement of amorphous Cd-As by analysis of partial radial distribution functions

Abstract

The anomalous wide angle X-ray scattering technique was used to determine the partial structure factors and then the partial radial distribution functions for vacuum evaporated Cd—As amorphous films containing 41 and 74% at. As. The experiments were performed using synchrotron radiation tuned near the As and Cd absorption edges. The obtained structural information about the individual Cd—Cd, Cd—As and As—As correlations shows that As and Cd remain almost tetrahedrally coordinated and suggest a certain degree of chemical disorder of the investigated samples.