DC pole | Wartość | Język |
dc.contributor.author | Malicka, Ewa | - |
dc.contributor.author | Sitko, Rafał | - |
dc.contributor.author | Zawisza, Beata | - |
dc.contributor.author | Heimann, Jan | - |
dc.contributor.author | Kajewski, Dariusz | - |
dc.contributor.author | Kita, Andrzej | - |
dc.date.accessioned | 2019-07-09T12:22:45Z | - |
dc.date.available | 2019-07-09T12:22:45Z | - |
dc.date.issued | 2011 | - |
dc.identifier.citation | Analytical and Bioanalytical Chemistry, Vol. 399 (2011), s. 3285–3292 | pl_PL |
dc.identifier.issn | 1618-2642 | - |
dc.identifier.issn | 1618-2650 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.12128/9620 | - |
dc.description.abstract | The paper presents possibilities and difficulties in
nondestructive analysis of small multielement single crystals
performed by means of X-ray spectrometry techniques:
micro-X-ray fluorescence spectrometry (μ-XRF), energydispersive
electron probe microanalysis (ED-EPMA), and
X-ray photoelectron spectroscopy (XPS). The capability of
the X-ray spectroscopy techniques in elemental analysis is
demonstrated with the single crystals of selenide spinels of
the general formula MxNyCrzSe4 (M+2 and N+3 are, for
example, Zn+2, V+3, Ga+3, Cd+2, In+3, and Sb+3). The
results of the nondestructive analyses (μ-XRF, ED-EPMA,
and XPS) are compared with those obtained by inductively
coupled plasma optical emission spectrometry (ICP-OES)
and wavelength-dispersive X-ray spectrometry (WDXRF)
following sample digestion. The present study shows
satisfactory agreement between the results of μ-XRF
analysis performed using the standardless fundamental
parameter method and the results obtained with the
WDXRF and ICP-OES analyses. If the measured single
crystal is precisely positioned, the difference between μ-
XRF and wet analysis (WDXRF and ICP-OES) does not exceed 5% rel. The reliable results of ED-EPMA can be
obtained only if the measured area is sufficiently large, i.e.,
of 200×300 μm. Even if this condition is fulfilled, the
relative difference between the ED-EPMA and the wet
analysis may reach 10% rel. In case of the XPS analysis,
the accuracy of results depends on the proper preparation of
the sample surface. It should be free of contamination that
can be obtained by scraping in situ in ultrahigh vacuum.
The ion etching, commonly used for cleaning the surface,
leads to preferential sputtering; therefore, the reliable results
cannot be obtained. | pl_PL |
dc.language.iso | en | pl_PL |
dc.rights | Uznanie autorstwa-Użycie niekomercyjne 3.0 Polska | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc/3.0/pl/ | * |
dc.subject | Micro-XRF | pl_PL |
dc.subject | EPMA | pl_PL |
dc.subject | XPS | pl_PL |
dc.subject | Selenide spinel | pl_PL |
dc.subject | Nondestructive analysis | pl_PL |
dc.subject | Chalcogenide compounds | pl_PL |
dc.title | Nondestructive analysis of single crystals of selenide spinels by X-ray spectrometry techniques | pl_PL |
dc.type | info:eu-repo/semantics/article | pl_PL |
dc.identifier.doi | 10.1007/s00216-010-4240-4 | - |
Pojawia się w kolekcji: | Artykuły (WNŚiT)
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